Improve Electronic Materials for Aerospace
Electronic materials appear as components in sensors, cockpit displays, and computing devices (chips). Accelrys solutions can help you predict fundamental properties of electronic materials (such as band gaps, dielectric constants), mechanical properties (such as elastic constants and hardness), and optical properties (such as reflectance).
Related Products and Services:
Design Improved Electrical Conductors and Insulators
Related Case Studies:
Towards Smaller, Faster Electronic Devices at the SFI Nanoscience Laboratory and
the University of North Carolina (Trinity College Dublin,
University of North Carolina at
Chapel Hill)
A Theoretical Approach to Investigating Gate Dielectrics (Motorola)
Discover Improved Emission Devices for Electronic Displays
Related Case Studies:
Effect of Adsorbates on Field Emission from Carbon Nanotubes (Motorola)
Create More Sensitive and Specific Devices for Both Mechanical and Chemical Sensing
Related Case Studies:
Understanding the Nitrogen Dioxide Sensing Mechanism of Tin Dioxide Nanoribbons
(Brookhaven & Lawrence Berkeley National Laboratories)
Application of Carbon Nanotubes as Electromechanical Sensors (NASA)
Nanotechnology ROI at e2v Technologies
- an Interview with Dr Richard Gilbert,
Principal Scientist (Biosensors) (e2v Technologies)
Bibliography: Improving Electronic Materials for Aerospace
- “Work function control at metal–oxide interfaces in CMOS,” K. Tse, J. Robertson, Materials Science in Semiconductor Processing 9 (2006) 964–968.
- “Theoretical investigations on electronic and optical properties of rock-salt gallium nitride,” Z.W. Chen, M.Y. Lv, L.X. Li, Q. Wang, X.Y. Zhang, R.P. Liu, Thin Solid Films 515 (2006) 2433–2436.
- “Formation of optically active osmium silicide in silica using ion implantation and thermal annealing,” L.J. Mitchell, O.W. Holland, A. Neogi, J. Li, F.D. McDaniel, Journal of Non-Crystalline Solids 352 (2006) 2408–2410.
- “Thermodynamic stability and band alignment at a metal–high-k dielectric interface,” A.A. Demkov, Phys. Rev. B 74 (2006) 085310.
- “Silicon doping induced bending in aluminum nanowires,” Hung-Jen Chen, Yen-Yu Chen, Chin-Hua Hsieh, Su-Jien Lin,Li-Jen Chou, and Wen-Kuang Hsu, Appl. Phys. Lett.90 (2007) 023111.